On the use of photocurrent imaging to determine carrier diffusion lengths in nanostructured thin-film field-effect transistors.

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On the use of photocurrent imaging to determine carrier diffusion lengths in nanostructured thin-film field-effect transistors.
Xiao, R., Hou, Y., Law, M., Yu, D. Journal of Physical Chemistry C, 122, 18356-18364 (2018). PDF Online Article